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Inspection Equipment×アヤハエンジニアリング - List of Manufacturers, Suppliers, Companies and Products

Inspection Equipment Product List

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Inline inspection device "CONTACT ACE series"

Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!

The "CONTACT ACE Series" is an inline inspection device compatible with both reflective and transmissive optical systems. The product in the same series, "CONTACT FILM," is a close-up surface defect inspection device that can automatically set mask positions (up to 48 locations) at the slit using dedicated software. This significantly reduces the effort required for inspection. By adopting a CIS (Contact Image Sensor), it does not use optical lenses, eliminating the influence of lens aberration at the edges and center of the field of view. 【Features (CONTACT FILM)】 ■ Designed for the film and coating industry ■ Space-saving compared to conventional cameras due to close-up imaging ■ Ideal for inspection just before winding and in narrow spaces after separation ■ Stable inspection across the entire field of view without being affected by lens aberration ■ Capable of inspecting a width of approximately 2000mm with a single camera *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Inline inspection device "AIRIS ACE series"

Emphasizing ease of use and expandability! A surface defect inspection device that can adapt flexibly to meet your needs!

The "AIRIS ACE Series" is an inline surface defect inspection device designed to match the characteristics of each industry. Considering the needs that will arise in 5 to 10 years, we emphasize expandability in both hardware and software. We support our customers with ease of use. We offer the base model of the series, "AIRIS-UC," and the "AIRIS-SP," which includes additional criteria for defect classification to meet a wider range of needs. 【Features】 ■ High expandability / Additional cameras and series ■ Multilingual support on the same platform ■ CoaXPress interface adopted ■ Processing capability improved by four times ■ Power consumption reduced by 43% *For more details, please refer to the PDF materials or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment

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Inline inspection device "FITS-3 Series"

Up to 4 series and expandable to 16 cameras! High resolution makes it possible to detect difficult defects!

The "FITS series" is a surface defect detection device that allows for the addition of cameras and series. With high resolution, it enables defect detection that is difficult to differentiate from the background. Algorithms effective for detecting uneven defects in strong backgrounds and faint line defects have become available. Additionally, the discrimination function allows for the classification of defects by type. 【Features】 ■ Can add cameras and series (up to 4 series, 16 cameras maximum) ■ Capable of compression processing ■ Can automatically identify the types of defects ■ A lineup that can be selected according to needs *For more details, please contact us.

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Electrode Sheet Inspection Device (Elins) eLINS

Surface Defect Detection Device Series

- Management values are established for the uncoated width, coated width, and substrate width, allowing for monitoring of width anomalies. - Since front and back misalignment can also be managed, it is possible to reduce the loss of coating materials.

  • Image Processing Equipment
  • Defect Inspection Equipment

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Offline inspection device "MICRO ACE series"

Customizable! A lineup of offline inspection devices capable of high-resolution testing.

The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.

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